STS: A Smarter Approach to Traditional ATE – National Instruments and TEVET
Today, you need a smarter alternative to traditional ATE to meet cost and functionality requirements of the increasingly complex RF and mixed-signal...
Requirements for semiconductor technology outpaces traditional testing approaches (analog, RF, mixed-signal, etc.) on a regular basis. Therefore, you need smarter solutions for cost, design, scalability, and challenges. NI’s solutions answer all these needs. See just a few of applications for these solutions:
Lab Characterization and Validation
You can also see how others have utilized NI’s semiconductor solutions in real-world applications:
IDT Lowers the Cost of Test with the Semiconductor Test System (STS)
Analog Devices Reduces Microelectromechanical System (MEMS) Test Cost
Qorvo Improves RF Power Amplifier Test Throughput
Want to increase your knowledge, network, and career? No need to answer the rhetorical question. Join us a NI Week in May to take advantage of discounted courses and certifications lead by NI experts.
Discounted Courses and Certifications at NI Week 2019
We will be there to take advantage of these courses, all the NI Week fun, and to visit with all our customers. Stop by to say hello or to get customized, streamlined procurement solutions.
You can always take advantage of upcoming and on-demand webinars too! Take a look at the ones coming this month.
4.1 – 4.4: Engineering Education Webinar Series
4.4.2019: Building your Communications Education from AM to Spread Spectrum Webinar
4.16.2019: How to Design Future-Proof Automotive Test Systems Webinar
4.16.2019: Use Simulation and Model-based Control to Bring Test Earlier in the Design Cycle Webinar
4.17.2019: Standardize on a Platform-based Test Architecture Webinar
4.18.2019: Build Scalable Distributed Test Systems: Data and Systems Management Strategies Webinar
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