Today, you need a smarter alternative to traditional ATE to meet cost and functionality requirements of the increasingly complex RF and mixed-signal ICs testing environment. As the challenges increased, the market for semiconductor ATE suppliers has shrunk. That’s where NI’s 40-year technical experience and TEVET’s 15-year procurement experience comes into play.
ATE Solutions in Real-World Applications
Our solutions are customer-defined, not vendor-defined, with smarter test solutions driven by future technologies – 5G, IoT, and smart vehicle. See how NI implements Semiconductor Test System (STS) approach to ATE for reduced test times, increased scalability, and cost-effectiveness in the case studies below. Make a change and go with a smarter approach to ATE testing.
ON Semiconductor Reduces Test Times with the Semiconductor Test System (STS)
Use the Strength of the PXI Platform for a Smarter Approach to IC Test
IDT Lowers the Cost of Test with the Semiconductor Test System (STS)
Interested in adding the NI Semiconductor Test System platform to your testing environment? Have technical questions? Or want to utilize TEVET’s unique procurement capabilities (including, but definitely not limited to, our SDVOSB and HUBZone designations)? Then, access the links below:
NI Semiconductor Test System
Ask NI
Contact TEVET
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