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TEVET White Paper: National Instruments Semiconductor Test System (STS)

TEVET White Paper: National Instruments Semiconductor Test System (STS)

Semiconductor testing has been a challenge for both the Integrated Circuit (IC) manufacturers and the companies who develop IC test systems due to rapid, constant advances within the industry.  In addition, the Input/Output (I/O) speed of ICs is ever increasing, pin count continues to increase, and new RF modulation schemes add layers of complexity. The industry was in need of a more efficient way to test ICs that could be seamlessly compatible with future technology and advancements.

In 2014, National Instruments (NI) presented their Semiconductor Test System (STS) based on their proven PXI modular instrumentation to offer an alternative to the “big iron” IC test OEMs like Advantest and Teradyne.

TEVET White Paper: COTS Software-Defined Radio Technology Accelerates RF System Deployment

TEVET White Paper: COTS Software-Defined Radio Technology Accelerates RF System Deployment

The Department of Defense (DoD) needs RF systems that are adaptable, interoperable, secure, and offer superior performance while also considering...

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TEVET White Paper: Astronics Test Systems and Tabor Electronics End Obsolescence for NAVAIR

TEVET White Paper: Astronics Test Systems and Tabor Electronics End Obsolescence for NAVAIR

Obsolescence. This is not a favorite word for most end users. Flexibility, options, extended product life - those words bring relief to the testing...

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TEVET White Paper: Answering Today's Need for Hand-held Test and Measurement Instruments

TEVET White Paper: Answering Today's Need for Hand-held Test and Measurement Instruments

Hand-held test instruments have been available for many years; however, previously they had the stereotype of "Go / No-Go" type devices in the field,...

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