TEVET Transmission | TEVET

Top 5 5G Device Test Challenges – NI’s Expertise

Written by Casey Coyne | Aug 8, 2019 12:00:36 PM

Engineers are facing challenges in design and test to ensure the performance of new chip designs. For wideband 5G IC test (and across the 5G industry), there are 5 test challenges and solutions that NI has expertise on:

  1. Waveforms are wider and more complex.
  2. Instruments need to be wideband and linear while maintaining cost-effective coverage of extensive frequency ranges.
  3. Component characterization and validation require more testing.
  4. Traditional measurements are spatially dependent because of over-the-air testing for massive MIMO and beamforming systems.
  5. High-volume production is demanding fast and efficient testing and scaling.

Access NI’s expertise for these 5G challenges and more with the link below.

 

NI 5G Expertise

 

Featured and On-Demand NI Webinars

Throughout the year, NI provides online and in-person webinars and seminars. But what if you can’t make that date? No problem. You can always take advantage of the on-demand webinar library. Take a look at the featured webinars and the direct link to the on-demand library.

Online Webinars

On-Demand Library

 

 

See You at AUTOTESTCON

Want customized procurement solutions? Want to speak with us in-person? Want to see live demonstrations? Then stop by our booth - 402 - at AUTOTESTON on August 26th-29th.

You can’t miss us – we are right inside the main entrance. See you then!

 

Contact TEVET