Keysight Boosts Speed with "TRUE" Parametric Per-Pin Architecture with New P9000 Test System

Keysight Technologies, TEVET premier partner, recently announced the third generation of its P9000 series massively parametric test system. The new generation makes the P9000 more cost efficient for testing and the industry’s fastest and most versatile semiconductor parametric test solution for R&D and mass production of advanced logic and memory ICs.

"Hundreds of the P9000 are already being used in R&D and in volume production by a number of semiconductor companies, such as advanced logic foundries and memory manufactures," said Masaki Yamamoto, vice president and general manager of Keysight's Wafer Test Solutions. "Keysight continues to enhance the P9000 to further reduce the customer's time-to-market and reduce the cost-of-test. The third-generation P9000 provides the fastest parallel parametric test solution, with a 100-pin, 'TRUE' parametric per-pin module, even with the test structures used in conventional test systems."

The third generation P9000 shortens the time of capacitance measurements which enables increased test volume. The enhanced DCM technology enables leaky capacitance measurements to be gather nearly 3X quicker than before. For even further improvement, the tester includes 100-pinn parallel capacitance measurement.

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