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NI’s Newest PXI Source Measure Unit is the Most Precise in the Industry

NI’s Newest PXI Source Measure Unit is the Most Precise in the Industry

With a 10 fA sensitivity and an output up to 200 V, engineers and researchers now have the perfect solution for measuring low-current signals. Increasing complexity in semiconductor devices demands more precise tests and the PXIe-4135 SMU delivers. It offers high channel density with up to 68 SMU channels in a single chassis, high speed test throughput, and the flexibility of programming with LabVIEW.

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NI’s Newest SDR Devices Feature the Widest Frequency Ranges, Highest Bandwidth, and Best RF Performance

NI’s Newest SDR Devices Feature the Widest Frequency Ranges, Highest Bandwidth, and Best RF Performance

TEVET key industry partner, National Instruments offers superior selectivity and sensitivity for over-the-air signal acquisition and analysis with...

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New NI Software for PXI RF Test Systems Reduces Measurement Time by Up to 33%!

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New NI Software for PXI RF Test Systems Reduces Measurement Time by Up to 33%!

TEVET key industry partner, National Instruments' new software NI-RFmmx 2.2 advanced measurement software for PXI RF test systems features algorithm...

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NI Introduces the Industry's First Remote Control Solution for PXI Systems Using Thunderbolt 3

NI Introduces the Industry's First Remote Control Solution for PXI Systems Using Thunderbolt 3

Build a smarter test system with National Instruments (NI), a TEVET strategic partner. Recently, NI introduced the PXIe-8301 remote control module,...

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