Semiconductor testing has been a challenge for both the Integrated Circuit (IC) manufacturers and the companies who develop IC test systems due to rapid, constant advances within the industry. In addition, the Input/Output (I/O) speed of ICs is ever increasing, pin count continues to increase, and new RF modulation schemes add layers of complexity. The industry was in need of a more efficient way to test ICs that could be seamlessly compatible with future technology and advancements.
In 2014, National Instruments (NI) presented their Semiconductor Test System (STS) based on their proven PXI modular instrumentation to offer an alternative to the “big iron” IC test OEMs like Advantest and Teradyne.