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Ten New Keysight PXIe Instruments Accelerate Testing with Onboard Field-Programmable Gate Arrays

Ten New Keysight PXIe Instruments Accelerate Testing with Onboard Field-Programmable Gate Arrays

TEVET presents 10 advanced Keysight PXIe instruments, including new arbitrary waveform generators (AWG), oscilloscopes, and digitizers. New Keysight AWG includes three highly synchronized channels for precise tuning of IQ waveforms and envelope tracking, as well as the industry's first full-featured PXI oscilloscope. Faced with evaluating emerging 5G and aerospace and defense wideband technologies, these instruments provide up to 1 GHz bandwidth supporting complex baseband IQ signal generation and analysis. The new AWGs and digitizers include on-board FPGAs and a graphical design environment for the ultimate flexibility and customization. In addition, the M3xxxA AWGs and digitizers use the FPGA and PXI reference clock to provide real-time sequencing and multi-channel/multi-module synchronization supporting advanced multi-channel applications like multi-user beamforming technologies and quantum computing.

Learn more below and let a TEVET expert help advance your technology and achieve new levels of performance.

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Versatile Semi-Conductor Testing with New SLT Platform from Astronics Test Systems

Versatile Semi-Conductor Testing with New SLT Platform from Astronics Test Systems

The newly expanded ATS 5034 System-Level Test (SLT) Platform from TEVET partner, Astronics Test Systems (ATS) features new semi-automatic solutions...

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Keep Testing Into the Future - TEVET and Keysight's Latest White Paper

Keep Testing Into the Future - TEVET and Keysight's Latest White Paper

Faster and more innovative testing is here! TEVET and Keysight Technologies have partnered to deliver you the technology that you need, when you need...

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Keysight Boosts Speed with

Keysight Boosts Speed with "TRUE" Parametric Per-Pin Architecture with New P9000 Test System

Keysight Technologies, TEVET premier partner, recently announced the third generation of its P9000 series massively parametric test system. The new...

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